Innovative analysis of X-ray microdiffraction images on selected applications of the Kossel technique

Authors
Bauch, J Brechbuhl, J Ullrich, HJ Meinl, G Lin, H Kebede, W
Citation
J. Bauch et al., Innovative analysis of X-ray microdiffraction images on selected applications of the Kossel technique, CRYST RES T, 34(1), 1999, pp. 71-88
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
34
Issue
1
Year of publication
1999
Pages
71 - 88
Database
ISI
SICI code
0232-1300(1999)34:1<71:IAOXMI>2.0.ZU;2-1
Abstract
Starting from the origin and the informational content of Kossel interferen ces excited by electron and synchrotron radiation beams selected examples o f microstructural applications, such as the precision determination of latt ice constants, the precision determination of crystallographic orientation of single grains, the determination of local stresses/strains and the deter mination of tetragonal distortions of cubic lattices including the descript ion of a variety of methods for analysis are presented.