X-ray analysis of self-organized InAs/InGaAs quantum dot structure

Citation
A. Krost et al., X-ray analysis of self-organized InAs/InGaAs quantum dot structure, CRYST RES T, 34(1), 1999, pp. 89-102
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
34
Issue
1
Year of publication
1999
Pages
89 - 102
Database
ISI
SICI code
0232-1300(1999)34:1<89:XAOSIQ>2.0.ZU;2-7
Abstract
We report on an X-ray study of an InAs/InGaAs/GaAs multi quantum dot stack grown by metalorganic chemical vapor deposition using grazing incidence ref lectometry, high-resolution X-ray diffraction, reciprocal space mapping and pole figure analysis. No direct signal from the quantum dots is found by t he high-resolution techniques. All rocking curves on different symmetric an d asymmetric Bragg reflections can be simulated within the framework of dyn amical theory assuming a perfect tretragonally distorted InAs/InGaAs/GaAs m ultiquantum well system. A pole figure analysis in the vicinity of the (113 ) and (022) reflections, however, reveals a signal from the quantum dots. T here is a considerable indium enrichment in the quantum dots as compared to the wetting layer indicating a strong In-diffusion during their formation. Moreover, a strongly anisotropic diffuse scattering distribution with resp ect to the [110] and [1 (1) over bar 0] directions is found.