Structural properties of CuGaxIn1-xSe2 thin films deposited by spray pyrolysis

Thin films of CuGaxIn1-xSe2 (x=0.0-1.0) have been prepared by spray pyrolys is onto soda-lime glass substrates heated to a temperature of 325 degrees C . The structure, crystal orientations, lattice parameters and grain size of the experimental films have been studied using the X-ray diffraction and s canning electron microscopy. All the deposited films were polycrystalline a nd showed single phase with an intense (112) orientation. The lattice param eters, a and c of the films vary linearly with the change of gallium compos ition. The grain size of the films decrease with the increase of gallium co ntent.