Software reliability demonstration testing with consideration of damage size of software failures

Citation
K. Sawada et H. Sandoh, Software reliability demonstration testing with consideration of damage size of software failures, ELEC C JP 3, 82(5), 1999, pp. 10-21
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE
ISSN journal
10420967 → ACNP
Volume
82
Issue
5
Year of publication
1999
Pages
10 - 21
Database
ISI
SICI code
1042-0967(199905)82:5<10:SRDTWC>2.0.ZU;2-0
Abstract
This article describes an extension of the conventional reliability demonst ration testing method that is based only on the number of software failures . A reliability demonstration testing method that also considers the size o f the damage by the failure is proposed. Both the software used continuousl y in time (continuous model) and the software used discretely in time (disc rete model) are considered. For each model of reliability demonstration tes ting, the producer's risk and the consumer's risk are formulated. A method is shown by which the testing can be designed when those risks are specifie d. Solution procedures are shown for the case where the damage size follows an exponential distribution and for the case where it follows a Poisson di stribution. The characteristics of the proposed method are discussed using numerical examples. (C) 1999 Scripta Technica.