K. Sawada et H. Sandoh, Software reliability demonstration testing with consideration of damage size of software failures, ELEC C JP 3, 82(5), 1999, pp. 10-21
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE
This article describes an extension of the conventional reliability demonst
ration testing method that is based only on the number of software failures
. A reliability demonstration testing method that also considers the size o
f the damage by the failure is proposed. Both the software used continuousl
y in time (continuous model) and the software used discretely in time (disc
rete model) are considered. For each model of reliability demonstration tes
ting, the producer's risk and the consumer's risk are formulated. A method
is shown by which the testing can be designed when those risks are specifie
d. Solution procedures are shown for the case where the damage size follows
an exponential distribution and for the case where it follows a Poisson di
stribution. The characteristics of the proposed method are discussed using
numerical examples. (C) 1999 Scripta Technica.