Polycrystalline silicon (polysilicon) is a material commonly used for micro
-electro-mechanical systems (MEMS) for which reliable mechanical properties
data is not available, especially for devices that have dimensions on the
order of microns. This paper proposes a method for using test data that acc
ounts for the uncertainties in mechanical properties and presents data from
tests of polysilicon that may be used in the future design of polysilicon
MEMS. The testing of 161 micro-devices to failure, results in a recommendat
ion for design that the nominal strain be maintained below 0.0055. (C) 1998
Elsevier Science Ltd. All rights reserved.