Characterization of thin metastable vanadium oxide films by Raman spectroscopy

Citation
Jp. Schreckenbach et al., Characterization of thin metastable vanadium oxide films by Raman spectroscopy, FRESEN J AN, 363(2), 1999, pp. 211-214
Citations number
19
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
ISSN journal
09370633 → ACNP
Volume
363
Issue
2
Year of publication
1999
Pages
211 - 214
Database
ISI
SICI code
0937-0633(199901)363:2<211:COTMVO>2.0.ZU;2-J
Abstract
Thin films are potentiodynamically generated on vanadium in Ba2+/acetate el ectrolyte systems at high voltages. The influence of the anodic potential u p to 400 V on the composition and structure of the about 500 nm thin anodic conversion films are investigated. Raman spectroscopy indicates that diffe rent film types depend on the electrochemical process parameters. The relat ionship between the Raman laser excitation power and the amorphous or micro crystalline film structure is also discussed. Beside metastable disordered structures the films contain crystalline phases of V2O5, V4O9 and barium va nadate, respectively.