SECONDARY-IONS FROM ATOMIC COLLISION PROCESSES IN SOLID-SURFACES

Citation
R. Neugebauer et al., SECONDARY-IONS FROM ATOMIC COLLISION PROCESSES IN SOLID-SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 124(2-3), 1997, pp. 418-421
Citations number
11
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
124
Issue
2-3
Year of publication
1997
Pages
418 - 421
Database
ISI
SICI code
0168-583X(1997)124:2-3<418:SFACPI>2.0.ZU;2-7
Abstract
Using time-of-flight technique (TOF) we investigated the secondary ion emission from an uncleaned carbon surface induced by fast helium bomb ardment near the maximum of electronic stopping power (dE/dx)(e). We e xamined the production of secondary ions dependend on projectile prope rties only, as specific projectile energy (50 keV/u less than or equal to E-p/m(p) less than or equal to 500 keV/u) and incident charge stat e (0 less than or equal to q(i) less than or equal to 2), but not on t arget properties, as surface conditions. The ''pre-equilibrium stoppin g power'' plays a major role in secondary ion production in the examin ated projectile velocity regime.