Simple method for estimating neutron-induced soft error rates based on modified BGR model

Citation
Y. Tosaka et al., Simple method for estimating neutron-induced soft error rates based on modified BGR model, IEEE ELEC D, 20(2), 1999, pp. 89-91
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
20
Issue
2
Year of publication
1999
Pages
89 - 91
Database
ISI
SICI code
0741-3106(199902)20:2<89:SMFENS>2.0.ZU;2-3
Abstract
Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER's), which is a modified version of the burst generation ra te (BGR) model. Our model can he used to easily and quickly estimate neutro n-induced soft error rates and provides a useful guideline for device and c ircuit engineers to estimate neutron-induced soft errors (SE's).