A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Authors
Pleskacz, WA Ouyang, CH Maly, W
Citation
Wa. Pleskacz et al., A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits, IEEE COMP A, 18(2), 1999, pp. 151-162
Citations number
18
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN journal
02780070 → ACNP
Volume
18
Issue
2
Year of publication
1999
Pages
151 - 162
Database
ISI
SICI code
0278-0070(199902)18:2<151:ADAFEO>2.0.ZU;2-D
Abstract
This paper(1) describes an algorithm for the extraction of the critical are a for opens, The presented algorithm allows for the analysis of industrial size IC's with non-Manhattan geometry. Illustrative examples of the propose d algorithm, implemented by using design rule checker operations, are prese nted. It is shown that the extraction of the critical area for realistic si ze VLSI circuits designs can be done in an acceptable time.