Substrate optimization based on semi-analytical techniques

Several methods are presented for highly efficient calculation of substrate noise transport in integrated circuits. A three-dimensional Green's functi on-based boundary element method, accelerated through use of the fast Fouri er transform, allows the computation of sensitivities with respect to all s ubstrate parameters at a considerably higher speed than any methods reporte d in the literature, Substrate sensitivities are used in a number of physic al optimization tools, such as placement and trend analysis, The aim is a f ast and accurate estimation of the impact of technology migration and/or la yout redesign on substrate noise and, ultimately, on the circuit's overall performance. The suitability of the approach is shown through industrial-st rength mixed-mode integrated circuits fabricated on a standard CMOS process .