Login
|
New Account
ITA
ENG
Contingency ranking for voltage collapse via sensitivities from a single nose curve - Discussion
Authors
Bose, A
Liu, H
Citation
A. Bose et H. Liu, Contingency ranking for voltage collapse via sensitivities from a single nose curve - Discussion, IEEE POW SY, 14(1), 1999, pp. 239-239
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON POWER SYSTEMS
ISSN journal
08858950 →
ACNP
Volume
14
Issue
1
Year of publication
1999
Pages
239 - 239
Database
ISI
SICI code
0885-8950(199902)14:1<239:CRFVCV>2.0.ZU;2-A