C. Piccirillo et al., INFLUENCE OF SUPPORT MATERIAL ON FORMATION OF ELECTROCATALYTIC THIN-FILMS - A SECONDARY-ION MASS-SPECTROMETRY STUDY, International journal of mass spectrometry and ion processes, 161(1-3), 1997, pp. 141-149
Citations number
19
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
The influence of various support materials, such as nickel and titaniu
m, on the structure of TiO2, RuO2, RuO2/TiO2 and IrO2/TiO2 electrocata
lytic thin films was investigated in detail by secondary ion mass spec
trometry (SIMS). The coatings were prepared by heat treatment followin
g literature procedure. It is shown that various support materials can
favor the formation and can influence the ion yield of ionic species
with different oxidation states. The penetration characteristics of Ti
O2 in two-component systems on the same support are influenced by the
nature of the noble metal. Furthermore, changes in the structure of th
e coatings due to method and time of storage may be detected by SIMS a
nalysis. (C) 1997 Elsevier Science B.V.