Superlattices consisting of As monolayers (MLs) in (In, Ga, Al)Sb and Sb ML
s in (In, Ga, Al)As were grown by molecular beam epitaxy and characterized
by x-ray diffraction, Raman spectroscopy, and high-resolution transmission
electron microscopy. In all cases, well-defined superlattices were formed w
hen the growth temperature was sufficiently low. As temperature increases f
or the As MLs in antimonides, substantial intermixing occurs. For Sb MLs in
arsenides, Sb evaporation from the surface increases with increasing growt
h temperature. These results are discussed in the context of device heteros
tructures containing InAs/GaSb and InAs/AlSb heterojunctions. [S0021-8979(9
9)05104-X].