Using frustrated total internal reflection spectroscopy to study color centers in crystals

Authors
Zhukova, EV Zolotarev, VM Margaryants, NB Shishatskaya, LP
Citation
Ev. Zhukova et al., Using frustrated total internal reflection spectroscopy to study color centers in crystals, J OPT TECH, 66(1), 1999, pp. 46-49
Citations number
16
Categorie Soggetti
Optics & Acoustics
Journal title
JOURNAL OF OPTICAL TECHNOLOGY
ISSN journal
10709762 → ACNP
Volume
66
Issue
1
Year of publication
1999
Pages
46 - 49
Database
ISI
SICI code
1070-9762(199901)66:1<46:UFTIRS>2.0.ZU;2-4
Abstract
This paper discusses the possibilities of using frustrated total internal r eflection spectroscopy to study the formation kinetics of color centers in the surface layer of crystals when they are irradiated by VUV radiation (11 -15 eV). (C) 1999 The Optical Society of America. [S1070-9762(99)00902-X].