The gate bias dependence of the field-effect mobility in pentacene-based in
sulated gate field-effect transistors (IGFETs) was interpreted on the basis
of the interaction of charge carriers with localized trap levels in the ba
nd gap. This understanding was used to design and fabricate IGFETs with mob
ility of more than 0.3 square centimeter per volt per second and current mo
dulation of 10(5), with the use of amorphous metal oxide gate insulators. T
hese values were obtained at operating voltage ranges as low as 5 volts, wh
ich are much smaller than previously reported results. An all-room-temperat
ure fabrication process sequence was used, which enabled the demonstration
of high-performance organic IGFETs on transparent plastic substrates, at Lo
w operating voltages for organic devices.