Stability of low pressure chemical vapour deposition amorphous silicon

Citation
M. Kostana et al., Stability of low pressure chemical vapour deposition amorphous silicon, THIN SOL FI, 337(1-2), 1999, pp. 78-81
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
337
Issue
1-2
Year of publication
1999
Pages
78 - 81
Database
ISI
SICI code
0040-6090(19990111)337:1-2<78:SOLPCV>2.0.ZU;2-E
Abstract
The study of the influence of phosphorous doping and hydrogen content on tr ansport propel ties and thermally induced metastability of low pressure che mical vapour deposition a-Si is reported. Introduction of hydrogen causes c hange of dominant carrier transport mechanism at room temperature. The ther mally induced metastability was observed in both unhydrogenated and hydroge nated P-doped a-Si films. In this paper we report our studies on the effect of the thermally induced metastability in unhydrogenated and hydrogenated films of LPCVD a-Si, as a function of phosphorous concentration. (C) 1999 E lsevier Science S.A. All rights reserved.