Some of the highlights of the ongoing program within the Sensor Scienc
e Group of APL's Milton S. Eisenhower Research and Technology Developm
ent Center to develop novel magnetometers are summarized. In particula
r, two approaches are described: a magnetostrictive device based on th
e deflection of a Terfenol-D coated single-crystal silicon cantilever
and a Lorentz-force device based on a classical xylophone resonator. B
oth magnetometers, even though at early stages of development, are sta
re of the art in terms of sensitivity and offer a number of advantages
for field applications: small size, high sensitivity, integration on
a silicon chip, and vector capability. Using standard microelectromech
anical system (MEMS) machining techniques, both classes-together with
others under consideration-can be fabricated into planar three-axis ma
gnetometers and into one- or two-dimensional arrays for magnetic imagi
ng applications.