THICKNESS DEPENDENCE OF GIANT MAGNETORESISTANCE OF CO20AG80 GRANULAR FILMS

The thickness dependence of magnetoresistance was studied for a series of thin Co20Ag80 films. The room temperature magnetoresistance in per pendicular configuration (CIP) was measured for as-deposited and annea led samples in fields up to 2 T. All samples were annealed for 10 min at temperatures ranging from 423 to 623 K at steps of 100 K. MR values growing with the thickness t were observed. MR varies steeply for sma ll t and saturates at larger thicknesses. Changes of the width of the MR curve with the film thickness were also analyzed.