Pattern recognition with high discrimination can be achieved with a morphol
ogical correlator. A modification of this correlator is carried out by use
of a binary slicing process instead of linear thresholding. Although the ob
tained correlation result is not identical to the conventional morphologica
l correlation, it requires fewer calculations and provides even higher disc
rimination. Two optical experimental implementations of this modified morph
ological correlator as well as some experimental results are shown. (C) 199
9 Optical Society of America.