MODELING OF THE SCAN PROCESS IN LATERAL FORCE MICROSCOPY

A model for the simulation of the profiling process of a scanning forc e microscope tip scanning a sample surface is introduced. Starting fro m the equations of motion, complete lateral force microscopy images as well as individual scan lines can be calculated. The model is applied to the constant-force mode of a lateral force microscope using a mode l potential for the tip-sample interaction which has the translational symmetry of a MoS2(001) surface. Comparison with recent experimental data shows good agreement. Subsequent analysis of the tip movement dem onstrates the characteristic two-dimensional stick-slip behavior of th e tip. In addition, the influence of the scan speed on the measured la teral forces is discussed. (C) 1997 Elsevier Science B.V.