Open-structure resonant technique for measuring the dielectric properties of materials

A newly developed resonant measurement technique is extended to include rot ationally symmetric materials in general. The technique involves a full wav e analysis of the fixture containing the material under test. Therefore, th e measurement technique is not restricted by the dimensions of the material or its electrical properties. This work describes the measurement techniqu e and provides a characterization of the TE0.11 resonant mode. Also, a meth od to account for conduction loss due to the surface resistance of the meta l walls of the fixture is presented. Experimental results are compared to p reviously reported values and are in excellent agreement.