In this paper an introduction is given to secondary electron emission
properties. It is shown that the reduced secondary emission yield delt
a/delta(m) as a function of the reduced primary energy E-p/E-m can be
described by a universal curve. It is found that it is easier to use t
he measurement of the maximum secondary electron emission delta(m) and
the energy E-m at which this maximum is reached to determine the suit
ability of a coating for use in the display than direct measurement of
the first crossover energy E-I. The value of delta(m) and E-m can be
used to derive E-I. Furthermore, it is observed that in any material t
he elastic fraction of the secondary electrons exhibits a universal be
haviour as a function of E-p. Fits to delta(E-p) and the energy distri
bution of the secondary electrons are proposed which can be used in Mo
nte Carlo simulations.