SECONDARY-ELECTRON EMISSION PROPERTIES

Citation
Jj. Scholtz et al., SECONDARY-ELECTRON EMISSION PROPERTIES, Philips journal of research, 50(3-4), 1996, pp. 375-389
Citations number
15
Categorie Soggetti
Engineering
Journal title
ISSN journal
01655817
Volume
50
Issue
3-4
Year of publication
1996
Pages
375 - 389
Database
ISI
SICI code
0165-5817(1996)50:3-4<375:SEP>2.0.ZU;2-8
Abstract
In this paper an introduction is given to secondary electron emission properties. It is shown that the reduced secondary emission yield delt a/delta(m) as a function of the reduced primary energy E-p/E-m can be described by a universal curve. It is found that it is easier to use t he measurement of the maximum secondary electron emission delta(m) and the energy E-m at which this maximum is reached to determine the suit ability of a coating for use in the display than direct measurement of the first crossover energy E-I. The value of delta(m) and E-m can be used to derive E-I. Furthermore, it is observed that in any material t he elastic fraction of the secondary electrons exhibits a universal be haviour as a function of E-p. Fits to delta(E-p) and the energy distri bution of the secondary electrons are proposed which can be used in Mo nte Carlo simulations.