Wh. Huang et Cl. Wey, ATPRG: An automatic test program generator using HDL-A for fault diagnosisof analog/mixed-signal integrated circuits, IEEE INSTR, 47(2), 1998, pp. 426-431
Citations number
10
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
HDL-A is an analog version of the Hardware Description Language which is su
itable for structural and behavioral descriptions and simulations of digita
l, analog, and mixed-signal circuits and systems. This paper presents an au
tomatic test program generator (ATPRG) for fault diagnosis of analog/mixed-
signal integrated circuits. The ATPRG is developed under the Mentor Graphic
s design system environment, where the units under test (UUT's) are modeled
in HDL-A and simulated by Accusim, and AMPLE (Advanced Multi-Purpose Langu
age) in Mentor Graphics Design system environment is used to define and exe
cute the generation process automatically. To increase the reliability and
quality, the generated test programs mill be verified and validated, A veri
fication process checks if the test programs are generated correctly and if
the generated test programs can effectively locate fault(s), The test prog
rams are validated by emulating the UUT's. The actual test can be run in a
fully automatic mode, or interactively.