A new symbolic method for analog circuit testability evaluation

Testability is a very useful concept in the field of circuit testing and fa ult diagnosis and can be defined as a measure of the effectiveness of a sel ected test point set, A very efficient approach for automated testability e valuation of analog circuits is based on the use of symbolic techniques. Di fferent algorithms relying on the symbolic approach have been presented in the past by the authors and in this work noteworthy improvements on these a lgorithms are proposed. The new theoretical approach and the description of the subsequent algorithm that optimizes the testability evaluation from a computational point of view are presented. As a result, in the computer imp lementation the roundoff errors are completely eliminated and the computing speed is increased. The program which implements this new algorithm is als o presented.