SANS study of CdS and CdSe quantum dot crystal growth in a silica matrix by sol-gel

Citation
N. De La Rosa-fox et al., SANS study of CdS and CdSe quantum dot crystal growth in a silica matrix by sol-gel, J SOL-GEL S, 13(1-3), 1998, pp. 629-633
Citations number
9
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
ISSN journal
09280707 → ACNP
Volume
13
Issue
1-3
Year of publication
1998
Pages
629 - 633
Database
ISI
SICI code
0928-0707(1998)13:1-3<629:SSOCAC>2.0.ZU;2-O
Abstract
Size and size distribution of the semiconductor nanocrystals embedded in a dielectric matrix play a dominant role in line broadening and the exciton q uantum confinement level. The results show new aspects of the CdS and CdSe crystal growth as quantum dots using small-angle neutron scattering techniq ues (SANS). Thus, the crystal growth influences the aggregation process of the silica network. The intensity difference of the scattering between the silica matrix and the composite accounts for the crystal size and their vol ume fraction. Under similar conditions CdS nanocrystals grow faster and big ger than CdSe ones.