Elaboration at 80 degrees C of SiO2 layers deposited by aerosol-gel process

Citation
M. Langlet et C. Vautey, Elaboration at 80 degrees C of SiO2 layers deposited by aerosol-gel process, J SOL-GEL S, 13(1-3), 1998, pp. 743-747
Citations number
5
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
ISSN journal
09280707 → ACNP
Volume
13
Issue
1-3
Year of publication
1998
Pages
743 - 747
Database
ISI
SICI code
0928-0707(1998)13:1-3<743:EA8DCO>2.0.ZU;2-T
Abstract
The aerosol-gel process is a thin film deposition technique based on the so l-gel polymerization of a liquid film deposited from an ultrasonically spra yed aerosol. SiO2 layers have been deposited by aerosol-gel process from TE OS solutions prepared using a two-step procedure. After a post-treatment at 80 degrees C, the layers have a remarkable abrasion resistance and a high refractive index. In this paper, the chemical mechanisms involved in the fo rmation of SiO2 layers at low temperature are studied by FTIR spectroscopy and related to the processing conditions.