The aerosol-gel process is a thin film deposition technique based on the so
l-gel polymerization of a liquid film deposited from an ultrasonically spra
yed aerosol. SiO2 layers have been deposited by aerosol-gel process from TE
OS solutions prepared using a two-step procedure. After a post-treatment at
80 degrees C, the layers have a remarkable abrasion resistance and a high
refractive index. In this paper, the chemical mechanisms involved in the fo
rmation of SiO2 layers at low temperature are studied by FTIR spectroscopy
and related to the processing conditions.