Study by Rutherford backscattering spectroscopy of the heterostructure of lead titanate thin films

A depth profile analysis of modified lead titanate thin films was performed by means of Rutherford Backscattering Spectroscopy (RBS). These films were deposited from sol-gel synthesized solutions onto platinized silicon subst rates and crystallized by thermal treatments at temperatures of about 650 d egrees C. The chemistry of the solution and the thermal treatment for cryst allization affect the heterostructure of the resulting films. Losses of lea d and formation of substrate-film interfaces are produced during the crysta llization of the films. These film characteristics determine their ferroele ctric response.