Wavelength measurement of the Ni-like soft-x-ray lasing lines and comparison to the atomic-physics calculation

Citation
H. Daido et al., Wavelength measurement of the Ni-like soft-x-ray lasing lines and comparison to the atomic-physics calculation, J OPT SOC B, 16(2), 1999, pp. 296-300
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
ISSN journal
07403224 → ACNP
Volume
16
Issue
2
Year of publication
1999
Pages
296 - 300
Database
ISI
SICI code
0740-3224(199902)16:2<296:WMOTNS>2.0.ZU;2-V
Abstract
A flat-field grazing-incidence spectrometer is used to measure the lasing s pectra that include Nd (Z = 60) through Ta (Z = 73), recorded on a backside -illumination-type CCD detector, where Z is the atomic number. In the spect ra from Nd through Ta plasmas, precision wavelengths of the lasing lines ar e determined with the well-known Al (Z = 13) lines as reference lines recor ded on the same CCD detector. The measured wavelengths are compared with th e result of the relativistic atomic-physics calculations. (C) 1999 Optical Society of America [S0740-3224(99)02502-3].