Imaging interferometric lithography: approaching the resolution limits of optics

Citation
Xl. Chen et Srj. Brueck, Imaging interferometric lithography: approaching the resolution limits of optics, OPTICS LETT, 24(3), 1999, pp. 124-126
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
24
Issue
3
Year of publication
1999
Pages
124 - 126
Database
ISI
SICI code
0146-9592(19990201)24:3<124:IILATR>2.0.ZU;2-J
Abstract
The resolution limits of conventional optical lithography reflect the low-p ass spatial-frequency [numerical aperture (NA)/lambda] filter characteristi cs of the imaging system. Imaging interferometric lithography extends the r esolution of optical lithography to the spatial-frequency limits of optics (2/lambda). Off-axis illumination downshifts the high-frequency components of the mask pattern. An interferometric beam at the wafer upshifts these fr equency components back to their original spatial frequencies following the lens. 2x reduction imaging interferometric lithography experiments demonst rate a continuous frequency coverage up to similar to 3N.A./lambda with a c onsequent threefold resolution enhancement. (C) 1999 Optical Society of Ame rica.