ATOMIC-FORCE MICROSCOPY STUDIES OF BARIUM-TITANATE THIN-FILMS PREPARED BY LASER MOLECULAR-BEAM EPITAXY

Citation
Df. Cui et al., ATOMIC-FORCE MICROSCOPY STUDIES OF BARIUM-TITANATE THIN-FILMS PREPARED BY LASER MOLECULAR-BEAM EPITAXY, Chinese Physics Letters, 14(2), 1997, pp. 134-137
Citations number
16
Categorie Soggetti
Physics
Journal title
ISSN journal
0256307X
Volume
14
Issue
2
Year of publication
1997
Pages
134 - 137
Database
ISI
SICI code
0256-307X(1997)14:2<134:AMSOBT>2.0.ZU;2-P
Abstract
Laser molecular beam epitaxy (laser MBE) technique was utilized to gro w the barium titanate (BaTiO3, BTO) thin films on SrTiO3(100) substrat es. The surface morphology of the BaTiO3 thin films was studied by ato mic force microscopy (AFM). Two- and three-dimensional AFM images were obtained. The root mean square surface roughness, the height profile, the histogram and the bearing ratio of the height distributions for t he BaTiO3 thin films were analyzed in detail. The results indicate tha t the laser MBE thin films exhibit an atomically smooth surface.