X-ray photoelectron spectroscopy analysis of bulk Pd-Ni-P metallic glasses

Citation
Fm. Alamgir et al., X-ray photoelectron spectroscopy analysis of bulk Pd-Ni-P metallic glasses, PHIL MAG B, 79(2), 1999, pp. 239-247
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICSELECTRONIC OPTICAL AND MAGNETIC PROPERTIES
ISSN journal
13642812 → ACNP
Volume
79
Issue
2
Year of publication
1999
Pages
239 - 247
Database
ISI
SICI code
1364-2812(199902)79:2<239:XPSAOB>2.0.ZU;2-Y
Abstract
The core-level and valence-band spectra were obtained from high-resolution X-ray photoelectron spectroscopy of the bulk glassy and crystalline PdxNi80 -xP20 (x = 20-70) alloys. Upon crystallization of glassy Pd40Ni40P20, which exhibits the highest glass stability, a small change in chemical bonding i s observed. This appears as a charge transfer from P atoms to Ni and Pd ato ms. The level of chemical bonding between 1" and the metals seems to increa se linearly as a function of x throughout the composition range. The densit y D(E-F) of states at the Fermi level is significantly lower for the alloys with respect to those of the d-band metals, in agreement with the Nagel-Ta uc criterion for glass stability. However, its value is not the lowest for the x = 40 composition which is most resistant to crystallization. The exis ting electronic models are not fully adequate for explaining the high glass stability of the Pd40Ni40P20 alloy.