Visible light emission from atomic scale patterns fabricated by the scanning tunneling microscope

Citation
C. Thirstrup et al., Visible light emission from atomic scale patterns fabricated by the scanning tunneling microscope, PHYS REV L, 82(6), 1999, pp. 1241-1244
Citations number
18
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
6
Year of publication
1999
Pages
1241 - 1244
Database
ISI
SICI code
0031-9007(19990208)82:6<1241:VLEFAS>2.0.ZU;2-1
Abstract
Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-termi nated Si(001) surfaces has been mapped spatially and analyzed spectroscopic ally in the visible spectral range. The light emission is based on a novel mechanism involving optical transitions between a tip state and localized s tates on the sample surface. The wavelength of the photons can be changed b y the bias voltage of the STM. The spatial resolution of the photon maps is as good as that of STM topographic images and the photons are emitted from a quasipoint source with a spatial extension similar to the size of a dang ling bond. [S0031-9007(98)08376-8].