C. Thirstrup et al., Visible light emission from atomic scale patterns fabricated by the scanning tunneling microscope, PHYS REV L, 82(6), 1999, pp. 1241-1244
Scanning tunneling microscope (STM) induced light emission from artificial
atomic scale structures comprising silicon dangling bonds on hydrogen-termi
nated Si(001) surfaces has been mapped spatially and analyzed spectroscopic
ally in the visible spectral range. The light emission is based on a novel
mechanism involving optical transitions between a tip state and localized s
tates on the sample surface. The wavelength of the photons can be changed b
y the bias voltage of the STM. The spatial resolution of the photon maps is
as good as that of STM topographic images and the photons are emitted from
a quasipoint source with a spatial extension similar to the size of a dang
ling bond. [S0031-9007(98)08376-8].