Jm. Zeng et al., The structural and electric behavior of SrBi2Ta2O9 ferroelectric thin films with H+ implantation, PHYS LETT A, 251(5), 1999, pp. 336-339
The structural and electrical characteristics of H+-implanted SrBi2Ta2O9 (S
BT) ferroelectric thin films were investigated by X-ray diffraction analysi
s and electrical measurements. 25 keV Ht with doses ranging from 1 x 10(14)
/cm(2) to 3 x 10(15)/cm(2) were implanted into the Sol-Gel prepared SET fer
roelectric thin films. The X-ray diffraction patterns of SET films show tha
t no difference appears in the crystalline structure of H+-implanted SET fi
lms compared with unimplanted films. Ferroelectric properties measurements
indicate that both remnant polarization and the coercive electric field of
H+-implanted SET films decrease with increasing the implantation dose. The
disappearance of ferroelectricity was found in the H+-implanted SET films u
p to a dose of 3 x 10(15)/cm(2). The leakage current-voltage (I-V) and capa
citance-voltage (C-V) characteristics of the H+-implanted SET films were al
so discussed before and after a recovery process. (C) 1999 Elsevier Science
B.V.