The temperature dependence of the low-temperature dielectric response is st
udied in o-TaS3 samples doped by Nh, Se, and Ni and for nominally pure ones
. It is found that the low-temperature dielectric constant depends anomalou
sly on doping and is higher for doped crystals. whereas the temperature dep
endence of the characteristic time of all samples follows the activation la
w with nearly the same activation energy similar to 400 K (T > 20 K). The o
bserved behaviour is inconsistent with all available explanations of the lo
w-temperature dielectric anomaly. (C) 1999 Published by Elsevier Science B.
V.