Details are given of a study of the characteristics of field-induced electr
on emission from hydrogen-free high sp(3) content (>90%) amorphous diamond
(a-D) film deposited on heavily doped (rho < 0.01 Ohm.cm) n-type monocrysta
lline Si (111) substrate. It is demonstrated that a-D film has excellent el
ectron field emission properties. The emission current can reach 0.9 mu A a
t applied field as low as 1 V/mu m, and the emission current density can be
about several mA/cm(2) under 20 V/mu m. The emission current is stable whe
n the beginning current is at 50 mu A within 72 h. Uniform fluorescence dis
play,of electron emission from the whole face of the a-D film under the ele
ctric field of 10-12 V/mu m is also observed. The contribution of excellent
electron emission property results from the smooth, uniform, amorphous sur
face and high sp(3) content of the a-D film.