The importance of imaging conditions in scanning tunneling microscopy for the determination of surface texture and roughness

Citation
M. Aguilar et al., The importance of imaging conditions in scanning tunneling microscopy for the determination of surface texture and roughness, SURF SCI, 420(2-3), 1999, pp. 275-284
Citations number
27
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
420
Issue
2-3
Year of publication
1999
Pages
275 - 284
Database
ISI
SICI code
0039-6028(19990120)420:2-3<275:TIOICI>2.0.ZU;2-S
Abstract
We show that the control conditions in the feedback loop of a scanning tunn eling microscope (STM) affect the values of the surface texture parameters, including fractal characterization, when they are calculated from STM imag es of the surface. The main surface texture parameters (such as the r.m.s. roughness, kurtosis, skewness, and average wavelength) show a strong depend ence on the conditions used in the feedback loop for imaging. Fractal chara cter changes also with feedback parameters. The quality of the STM images c an be measured quantitatively by using some of the surface texture paramete rs. (C) 1999 Elsevier Science B.V. All rights reserved.