Dry etching of GaN substrates for high-quality homoepitaxy

Citation
M. Schauler et al., Dry etching of GaN substrates for high-quality homoepitaxy, APPL PHYS L, 74(8), 1999, pp. 1123-1125
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
8
Year of publication
1999
Pages
1123 - 1125
Database
ISI
SICI code
0003-6951(19990222)74:8<1123:DEOGSF>2.0.ZU;2-1
Abstract
Chemically assisted ion-beam etching (CAIBE) was used to remove subsurface damage from polished GaN bulk substrates prior to growth. Subsequently, GaN layers were deposited by metalorganic vapor phase epitaxy. Only the CAIBE- treated areas reveal a mirror-like surface without trenches, scratches, or holes. A dramatic increase of crystal quality is determined by low-temperat ure cathodoluminescence (CL). Compared to not CAIBE-treated material, the C L intensity is improved by a factor of 1000 and the linewidth is ten times narrower. (C) 1999 American Institute of Physics. [S0003-6951(99)02608-X].