Core and valence level characterization of the interfacial reaction between partially oxidized Ti films and graphite

The solid state reaction between partially oxidized Ti films and highly ori ented pyrolitic graphite (HOPG) was studied by soft X-ray photoelectron spe ctroscopy (PES). The reaction readily occurs upon room-temperature depositi on, and is apparently catalyzed by the presence of oxide species. The inter facial reaction is also characterized by its influence on the surface elect ronic structure of HOPG through modification of the C 1s core-hole screenin g process. The characteristics of the electronic structures of the films an d the interface are described by analysis of the valence band photoemission spectra. An electron-transfer model, previously suggested by the other wor kers, may be used to describe this catalytical reaction. (C) 1999 Published by Elsevier Science B.V.