Modifications of polyether-etherketone surface after 193 nm and 248 nm excimer laser radiation

Citation
P. Laurens et al., Modifications of polyether-etherketone surface after 193 nm and 248 nm excimer laser radiation, APPL SURF S, 139, 1999, pp. 93-96
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
139
Year of publication
1999
Pages
93 - 96
Database
ISI
SICI code
0169-4332(199901)139:<93:MOPSA1>2.0.ZU;2-Y
Abstract
The modifications induced by excimer laser radiations on polyether-etherket one surfaces have been investigated depending on the laser process paramete rs for laser fluences below the material ablation threshold. In the case of a 193 nm laser treatment, an important increase of the adhesive properties of PEEK is obtained due to the formation of new polar and reactive groups on the surface. The content of these reactive groups has to be controlled s ince their presence in high concentration may also have a negative effect o n the mechanical properties of the treated surface. Laser treatments using a 248 nm radiation never lead to a significant increase in the adhesive bon ding properties of PEEK. This probably results from a thermal degradation o f the surface at this laser wavelength. (C) 1999 Elsevier Science B.V. All rights reserved.