Laser deposition of YBaCuO thin films: stress measurements and microstructure investigations

Citation
Rj. Gaboriaud et F. Pailloux, Laser deposition of YBaCuO thin films: stress measurements and microstructure investigations, APPL SURF S, 139, 1999, pp. 549-551
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
139
Year of publication
1999
Pages
549 - 551
Database
ISI
SICI code
0169-4332(199901)139:<549:LDOYTF>2.0.ZU;2-M
Abstract
Superconducting thin films of YBaCuO have been deposited by laser ablation at 750 degrees C on MgO (001) single crystals. X-ray pole figures indicate a high crystalline quality of c-axis oriented films. A four-circle X-ray go niometer has been used for the measurements of the internal stress in the f ilms by means of the fundamental metric tensor method generally used in the field of continuum mechanics. Microstructural investigation has been done by HRTEM on plan-view samples in order to study the film-substrate epitaxy relations from the observation of the moire pattern brought about by the su perimposition of both YBaCuO and MgO lattices (9% misfit). The results are discussed in terms of crystallographic accommodation and stress relaxation between the film and the substrate. (C) 1999 Elsevier Science B.V. All righ ts reserved.