DIFFUSION-CONTROLLED CURRENT DENSITIES CLOSE TO A RIGHT-ANGLED ELECTRODE EDGE

The current density close to the edge of an electrode may be either en hanced or diminished compared with current densities remote from the e dge. This effect is quantified here for the case of diffusion-controll ed currents at a planar electrode which abuts either a second electrod e face or an insulating plane. Concentrations in the vicinity of the e lectrodes are also investigated. The cases of right-angled junctions r eceive special attention.