Structure and defects in thin C-60 films

Authors
Manaila, R Geru, II Fratiloiu, D Spoiala, DM Dihor, IT Devenyi, A
Citation
R. Manaila et al., Structure and defects in thin C-60 films, FUL SCI TEC, 7(1), 1999, pp. 59-75
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
FULLERENE SCIENCE AND TECHNOLOGY
ISSN journal
1064122X → ACNP
Volume
7
Issue
1
Year of publication
1999
Pages
59 - 75
Database
ISI
SICI code
1064-122X(1999)7:1<59:SADITC>2.0.ZU;2-T
Abstract
Thin C-60 films were deposited by vacuum sublimation of soot on single-crys tal and amorphous substrates. The absence of higher fullerenes was confirme d by IR, Raman and UV-VIS spectroscopy. X-ray diffraction revealed a high d ensity of stacking faults (probabilities in the range 10(-2)), correlated w ith lattice distortions. Analysis of the W-VIS absorption bands yielded val ues of the h(u)-->t(1g) and h(u)-->t(1u) optical gaps.