CHARACTERIZATION OF COPPER-OXIDE LAYERS BY ELECTROCHEMICAL METHODS

Citation
O. Forsen et al., CHARACTERIZATION OF COPPER-OXIDE LAYERS BY ELECTROCHEMICAL METHODS, Transactions of the Institute of Metal Finishing, 75, 1997, pp. 65-69
Citations number
13
Categorie Soggetti
Metallurgy & Metallurigical Engineering","Materials Science, Coatings & Films
ISSN journal
00202967
Volume
75
Year of publication
1997
Part
2
Pages
65 - 69
Database
ISI
SICI code
0020-2967(1997)75:<65:COCLBE>2.0.ZU;2-Z
Abstract
The applicability of electrochemical methods for the characterization of oxide layers on copper was examined. The oxide layers were formed a t high temperature in air atmosphere and electrochemically in carbonat e and bicarbonate solutions. The test methods were cathodic polarisati on measurements, cyclic voltammograms and galvanostatic reduction. The composition and the thickness of oxide layers were determined from th e galvanostatic curves. The reduction potential range indicates the co mposition of oxide layer and the reduction time indicates the thicknes s of the layer in the galvanostatic E-t curves. The 0,1 M Na2CO3 elect rolyte gave the sharpest reduction peaks in cyclic voltammograms. The cyclic voltammograms also proved that the oxide layers formed in air a t higher temperature differ from the electrochemically formed oxide la yers. Both the parabolic and the logarithmic oxidation rate laws were found to be applicable in air oxidation.