Atomic emission determination of boron, germanium, molybdenum, silver, tin, thallium, and tungsten in certified reference materials recommended for analytical data monitoring in global geochemical mapping

Citation
Ai. Kuznetsova et al., Atomic emission determination of boron, germanium, molybdenum, silver, tin, thallium, and tungsten in certified reference materials recommended for analytical data monitoring in global geochemical mapping, J ANALYT CH, 54(2), 1999, pp. 186-190
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL CHEMISTRY
ISSN journal
10619348 → ACNP
Volume
54
Issue
2
Year of publication
1999
Pages
186 - 190
Database
ISI
SICI code
1061-9348(199902)54:2<186:AEDOBG>2.0.ZU;2-K
Abstract
Atomic emission spectrometry was used for determining the concentrations of B, Sn, Mo, Ge, Tl, W, and Ag in sets of certified reference materials of r ocks, soils, and mellow soils recommended for the optimization of analytica l methods used in Global Geochemical Mapping. A collection of samples (IGGS series: GSR, GSD, and GSS; China) and Russian-certified reference material s produced at the Vinogradov Institute of Geochemistry of the Siberian Divi sion of the Russian Academy of Sciences (IGI series: SDU-1, ST-2, SGD-2, SK D-1, SSV-1, SG-1a, BIL-1, and BIL-2), and at the Vinogradov Institute of Ge ochemistry and the Institute of Applied Physics of Irkutsk State University in collaboration (IGI and RiAp series: SGKh-1, -3, and -5; SGKhM-1, -2, -3 , and -4; and SG-3) were analyzed. Regression analysis showed good concorda nce of the certified and found concentrations of the studied elements in th e certified reference materials of all of the test series. This means that certified reference materials produced in Russia can be recommended as seco ndary samples of natural media to provide reliability for the analytical da ta for Global Geochemical Mapping. The data for certified reference materia ls either with preliminary (approximate) concentrations of several elements or without even approximate parameters obtained under the same analytical conditions as for certified standard reference materials are reported.