XPS and bonding: when and why can relaxation effects be ignored

Citation
Tl. Barr et al., XPS and bonding: when and why can relaxation effects be ignored, J ELEC SPEC, 99, 1999, pp. 95-103
Citations number
23
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
99
Year of publication
1999
Pages
95 - 103
Database
ISI
SICI code
0368-2048(199901)99:<95:XABWAW>2.0.ZU;2-V
Abstract
The arguments behind the use of the term 'chemical Shift' in X-ray photoele ctron (ESCA) spectroscopy are explored. The factors that relate to initial state (chemical) vs final state (relaxation) contributions are described al ong with relationships to applied cases, with a particular emphasis on oxid es. It is demonstrated that some major classes of oxides, such as silicates , are excellent examples of systems for which the measured binding energy s hifts are directly related to differences in initial state chemistry. (C) 1 999 Elsevier Science B.V. All rights reserved.