A. Galtayries et J. Grimblot, Formation and electronic properties of oxide and sulphide films of Co, Ni and Mo studied by XPS, J ELEC SPEC, 99, 1999, pp. 267-275
Citations number
28
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Dry O-2 oxidation up to 400 degrees C, water immersion at room temperature
or H2S sulphidation at 400 degrees C forms oxide or sulphide films on polyc
rystalline Co and Ni foils. X-ray photoelectron spectra (XPS) of the Co 2p
and Ni 2p core levels and valence band (VB) structure changes allow the ide
ntification of the chemical state of such films and their electronic proper
ties. They are compared with the films obtained on Mo in similar conditions
. Ni appears less reactive than Co during O-2 or water oxidation and is con
sidered as a more noble metal. Dry oxidation mainly induces CoO while water
immersion induces formation of CoO(OH). For Ni, phases like Ni2O3, Ni(OH)(
2) and/or NiO(OH) are the most probable products, respectively. H2S sulphid
ation always produces a sulphur-rich Co or Ni phase. The VB response to sul
phidation of the three studied metals shows that Co or Ni sulphides are pot
ential electron-donors to MoS2. Such results an relevant to the synergy obs
erved in hydrotreating catalysis with these sulphides. (C) 1999 Elsevier Sc
ience B.V. All rights reserved.