Conductance through atomic contacts created by scanning tunneling microscopy

Citation
C. Kilic et al., Conductance through atomic contacts created by scanning tunneling microscopy, J ELEC SPEC, 99, 1999, pp. 335-343
Citations number
43
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
99
Year of publication
1999
Pages
335 - 343
Database
ISI
SICI code
0368-2048(199901)99:<335:CTACCB>2.0.ZU;2-A
Abstract
We investigate conductance through contacts created by pressing a hard tip, as used in scanning tunneling microscopy, against substrates, Two differen t substrates are considered, one a normal metal (Cu) and another a semi-met al (graphite). Our study involves the molecular dynamics simulations for th e atomic structure during the growth of the contact, and selfconsistent fie ld electronic structure calculations of deformed bodies. We develop a theor y predicting the conductance variations as the tip approaches the surface. We offer an explanation for a quasiperiodic variation of conductance of the contact on the graphite surface, a behavior which is dramatically differen t from contacts on normal metals, (C) 1999 Elsevier Science B.V. All rights reserved.