T. Matsui et al., Formation of unknown magnetic phase by solid state reaction of thin multilayered films of 75at%Mn-25at%Ge, J MAGN MAGN, 192(2), 1999, pp. 247-252
Solid-state phase formation in Mn/Ge thin multilayered films with the compo
sition of 75 at%Mn-25 at%Ge was investigated. The kappa-Mn5Ge2(LT) and zeta
-Mn5Ge2(HT) phases were identified on annealing at 773 K. Although zeta-Mn5
Ge2 is known to be a high-temperature phase above 900 K, the formation of t
his phase was confirmed on 773 K annealing. This may be due to non-equilibr
ium thin film reaction process in multilayered films. Whereas on annealing
at 973 K, the unknown magnetic phase with a tetragonal cell structure was f
ormed. The lattice constant was determined to be a = 0.5174 and c = 1.580 n
m by micro beam electron diffraction. The saturation magnetization of this
phase is 2.4 emu/g at room temperature and 160 emu/g at low temperature (5
K), which is almost equal to the magnetization of ferromagnetic eta-Mn5Ge3.
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