Deep levels in low temperature GaAs probed by field effect deep level transient spectroscopy

Citation
Nc. Halder et T. Goodman, Deep levels in low temperature GaAs probed by field effect deep level transient spectroscopy, J VAC SCI B, 17(1), 1999, pp. 60-67
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
1
Year of publication
1999
Pages
60 - 67
Database
ISI
SICI code
1071-1023(199901/02)17:1<60:DLILTG>2.0.ZU;2-S
Abstract
Low temperature (LT) GaAs grown on semi-insulating GaAs by molecular beam e pitaxy has been investigated by field effect deep level transient spectrosc opy at several reverse bias fields ranging from -1x10(5) to -4x10(5) V/cm. The activation energy, capture cross section, and electron-phonon coupling parameter all have been found to be modulated by the applied field. The the ories of the Schottky effect and the electron-phonon coupling effect have b een considered to interpret the electron conduction mechanisms in LT GaAs. (C) 1999 American Vacuum Society. [S0734-211X(99)00901-4].