Robust optical delivery system for measuring substrate temperature during molecular beam epitaxy

Citation
Pm. Thibado et al., Robust optical delivery system for measuring substrate temperature during molecular beam epitaxy, J VAC SCI B, 17(1), 1999, pp. 253-256
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
1
Year of publication
1999
Pages
253 - 256
Database
ISI
SICI code
1071-1023(199901/02)17:1<253:RODSFM>2.0.ZU;2-1